Considering that fine wire production environments often involve simultaneous production of multiple wires, the LN-2000 and LN-3000 systems feature multiple detection heads, enabling a single host to support up to 16 detection heads for monitoring 16 production lines simultaneously.

The LN-1005 and LN-2004 measurement heads integrate advanced miniaturized optoelectronic components and high-speed analog signal processing technology, offering a solution for non-contact detection of micron-level surface particle defects.

Applicable Diameter Range	0.02 mm - 5 mm
Applicable Line Speed	5 - 1500 m/min

During production, defects such as concave and convex irregularities are often caused by issues with raw materials, processes, or equipment.

The LN series micro-wire particle defect detector uses advanced miniaturized optoelectronic components and high-speed analog signal processing technology, offering an innovative solution for non-contact detection of micron-level particle defects on surfaces. It is especially suitable for monitoring various process steps on high-speed production lines, including drawing, coating, sheathing, and coloring. The system can accurately detect and characterize a range of fine defects, such as bulges, necking, blisters, bubbles, coarse segments, scratches, particle contamination, coating delamination, and bruises.

Applicable Diameter Range	0.015 mm - 0.8 mm
Applicable Line Speed	5 - 1500 m/min

The HV-1000 is a high-voltage testing system designed specifically for detecting insulation defects in enameled wires. It generates adjustable DC high voltage from 200V to 3000V, making it ideal for testing the insulation quality of wires of various specifications. The system allows precise voltage adjustments to meet the requirements of different wire types.

Applicable Diameter Range	0.02 mm - 1 mm
Applicable Line Speed	5 - 1500 m/min
Voltage Range	200V - 3000V

The high-voltage pinhole and particle defect detection system combines the HV series high-voltage pinhole detection system and the LN series fine wire particle defect detection system, providing a comprehensive solution for simultaneous high-voltage pinhole and fine wire particle defect detection. Utilizing two distinct detection principles, the system performs non-contact surface defect and high-voltage pinhole inspections, ensuring effective quality monitoring under high-speed production conditions.

Applicable Diameter Range	0.02 mm - 1 mm
Applicable Line Speed	5 - 1500 m/min
Voltage Range	200V - 3000V