LN Series Concave and Convex Particle Defect Detector
During production, defects such as concave and convex irregularities are often caused by issues with raw materials, processes, or equipment.
The LN series micro-wire particle defect detector uses advanced miniaturized optoelectronic components and high-speed analog signal processing technology, offering an innovative solution for non-contact detection of micron-level particle defects on surfaces. It is especially suitable for monitoring various process steps on high-speed production lines, including drawing, coating, sheathing, and coloring. The system can accurately detect and characterize a range of fine defects, such as bulges, necking, blisters, bubbles, coarse segments, scratches, particle contamination, coating delamination, and bruises.
The LN series micro-wire particle defect detector uses advanced miniaturized optoelectronic components and high-speed analog signal processing technology, offering an innovative solution for non-contact detection of micron-level particle defects on surfaces. It is especially suitable for monitoring various process steps on high-speed production lines, including drawing, coating, sheathing, and coloring. The system can accurately detect and characterize a range of fine defects, such as bulges, necking, blisters, bubbles, coarse segments, scratches, particle contamination, coating delamination, and bruises.
| Applicable Diameter Range | 0.015 mm - 0.8 mm |
| Applicable Line Speed | 5 - 1500 m/min |